{"id":3978,"date":"2023-01-07T18:50:45","date_gmt":"2023-01-07T18:50:45","guid":{"rendered":"http:\/\/cad4security.org\/?page_id=3978"},"modified":"2023-07-10T14:27:15","modified_gmt":"2023-07-10T14:27:15","slug":"ch15_universal_fault_sensor","status":"publish","type":"page","link":"http:\/\/cad4security.org\/index.php\/trainings\/hsl\/ch15_universal_fault_sensor\/","title":{"rendered":"Chapter 15: Universal Fault Sensor"},"content":{"rendered":"\n<h2 class=\"is-style-subheading wp-block-heading\"><strong>Chapter 15<\/strong><\/h2>\n\n\n\n<h2 class=\"is-style-subheading wp-block-heading\" style=\"font-style:normal;font-weight:100\">Universal Fault Sensor<\/h2>\n\n\n\n<p>Over the past two decades, fault-injection methods have evolved into very effective attacks to cause integrity or confidentiality violations in integrated circuits or electronic systems. Fault-injection attacks (FIAs) can be carried out using clock-glitch, voltage glitch, laser, optical instruments, electromagnetic (EM) emanation, and more. One promising solution to detect FIAs is to use on-chip sensors to capture the attacks effect. However, having different types and techniques of FIAs enforces using the custom-designed sensors for each type of attack, which is challenging and introduces a large overhead. In this regard, there is a need for a lightweight and universal solution that can efficiently detect different FIAs. This chapter aims to help readers learn about a unique, unified, on-chip solution against FIAs.\u00a0 Further, we demonstrate how to implement a universal Fault-to-Time Converter (FTC) sensor in FPGA platforms and how it can effectively detect and differentiate various FIA attack scenarios.<\/p>\n\n\n\n<div class=\"wp-block-buttons is-layout-flex wp-block-buttons-is-layout-flex\">\n<div class=\"wp-block-button\"><a class=\"wp-block-button__link button\" href=\"http:\/\/cad4security.org\/wp-content\/uploads\/Chapter15_Universal-Fault-Sensor.zip\">download chapter files<\/a><\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p>Chapter 15 Universal Fault Sensor Over the past two decades, fault-injection methods have evolved into very effective attacks to cause integrity or confidentiality violations in integrated circuits or electronic systems. Fault-injection attacks (FIAs) can be carried out using clock-glitch, voltage glitch, laser, optical instruments, electromagnetic (EM) emanation, and more. One promising solution to detect FIAs &hellip;<\/p>\n","protected":false},"author":6,"featured_media":2565,"parent":3964,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"_genesis_hide_title":false,"_genesis_hide_breadcrumbs":false,"_genesis_hide_singular_image":false,"_genesis_hide_footer_widgets":false,"_genesis_custom_body_class":"","_genesis_custom_post_class":"","_genesis_layout":"","footnotes":""},"acf":[],"_links":{"self":[{"href":"http:\/\/cad4security.org\/index.php\/wp-json\/wp\/v2\/pages\/3978"}],"collection":[{"href":"http:\/\/cad4security.org\/index.php\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"http:\/\/cad4security.org\/index.php\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"http:\/\/cad4security.org\/index.php\/wp-json\/wp\/v2\/users\/6"}],"replies":[{"embeddable":true,"href":"http:\/\/cad4security.org\/index.php\/wp-json\/wp\/v2\/comments?post=3978"}],"version-history":[{"count":4,"href":"http:\/\/cad4security.org\/index.php\/wp-json\/wp\/v2\/pages\/3978\/revisions"}],"predecessor-version":[{"id":4628,"href":"http:\/\/cad4security.org\/index.php\/wp-json\/wp\/v2\/pages\/3978\/revisions\/4628"}],"up":[{"embeddable":true,"href":"http:\/\/cad4security.org\/index.php\/wp-json\/wp\/v2\/pages\/3964"}],"wp:featuredmedia":[{"embeddable":true,"href":"http:\/\/cad4security.org\/index.php\/wp-json\/wp\/v2\/media\/2565"}],"wp:attachment":[{"href":"http:\/\/cad4security.org\/index.php\/wp-json\/wp\/v2\/media?parent=3978"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}